Press-Conference, dedicated to the opening of VIT Expo 2008

Book presentation: Y. Vizilter, S. Zheltov, V. Knyaz, A. Khoderev and A. Morzhin, "Processing and Analysis of Numeric Images. Illustration on LabView and IMAQ"

Demonstration: Equipment & Software for Machine Vision and Video-Images Processing by "National Instruments"

Speakers: National Instruments Russia and FGUP "GosNIIAS"

International Science Engineering Seminar "Optical Metrology — for Design, Manufacturing and Quality Assurance"

Key themes:

• Optical metrology: New Methods and Technologies
• Instruments and Software for Optical Metrology
• Accomplished Solutions for Designing and Details Forms Controlling
• Applications of Optical Metrology Systems in Researches and in Practice
• Regulating Norms in Optical Metrology Systems Applications
• Round-Table Discussion on Optical Metrology Systems

Speakers:

• FGUP "GosNIIAS"
• The Fraunhofer Institute for Factory Operation and Automation IFF
• With RF Federal Agency of Industry assistance

Subject: Metering Systems in Geometry and Objects Identification with Intellectual Methods "SICK" / IVP and NI LabVIEW. Illustrating Examples.

Speaker: VITEC, SICK

Subject: Omron Engineering Vision Systems. From uncomplicated examples up to complex tasks.

Speaker: Omron Electronics

Subject: Machine vision as a whole of medical robotized microscopy MECOS-C2.

Speaker: MECOS, ZAO

Subject: Video analytics and biometrics in the systems of video viewing

Speaker: ITV, Institute of Information Technologies (IIT)